1、Optical Fundamentals for Advanced Thin Film Coatings: EUV through LWIR
Corning Advanced Optics - Corning Research and Development Corporation
2、Scattering studies in connection with the development of interferometric gravitational wave detectors
Michel Lequime, Institut Fresnel
3、SC Innovative Techniques for the Metrology of Optical Coating PropertiesMichel Lequime, Institut Fresnel
Since the end of the 1990s, the simultaneous availability of powerful optical filter design software and reliable thin-film deposition techniques using energetic processes such as ion beam assistance, ion beam sputtering or magnetron sputtering have made possible the manufacture of high-performance optical interference coatings comprising a great number of layers, from one hundred up to a few thousand. For highly demanding applications such as observation of the Earth from space, wavelength multiplexing of high data rate optical telecommunications channels, study of the organization of living matter at the cellular scale, or interferometric detection of gravitational waves, it is necessary to confirm by very accurate measurements the theoretical figures provided by the design, especially for some key filter parameters like optical density in the blocking regions steepness of band edges , or wavelength and angle resolved scattering.
The objective of this course is first to recall some fundamentals on the detection of optical signals, and second to use these basics to explain the structure and the performances of spectrophotometric apparatus developed in the three following goals
• Ultra-wide range measurement of the spectral transmittance of optical interference filters
• Angle and wavelength resolved measurement of the light scattered by optical components
• Detection of localized defects at the surface of a plane optical window using spatially and angularly resolved detection of scattered light
This course is of use for anyone who are interested in the development of high-level spectrophotometric instrumentation. It is addressed to junior and senior scientists as well as to engineer and science students of higher terms.
Michel Lequime is Eméritus Professor at Centrale Marseille, a French engineer high school and senior scientist in the Concept team of Institut Fresnel. Currently, his research interests concern the comprehensive characterization of optical components through spatially and angularly resolved light scattering measurements and the theoretical study of optical properties of thin-film stacks including metamaterials layers. He is credited with twenty-six patents and three hundred publications and presentations in the areas of non-linear optics, space optics, fiber optic sensors, scattering phenomena and optical interference coatings. He is a member of the OSA and SPIE, and has served as Secretary of the Board of the French Optical Society (SFO, 2009-13).